DocumentCode :
3748967
Title :
Far-field effect in unipolar electrograms recorded from epicardial and endocardial surface: Quantification of epi-endo dissociation during atrial Fibrillation in Humans
Author :
Piotr Podziemski;Stef Zeemering;Elham Bidar;Pawel Kuklik;Arne van Hunnik;Ulrich Schotten
Author_Institution :
Faculty of Physics, Warsaw University of Technology, Poland
fYear :
2015
Firstpage :
497
Lastpage :
500
Abstract :
In this study we explore whether endo-epicardial dissociation during atrial fibrillation (AF) can explain origin of some of the far-field components in unipolar electrograms. To assess the number of far-field deflections in unipolar electrograms that have a source on the contralateral side of the atrial wall we used simultaneous endo-epicardial high-resolution contact mapping. 30s endo-epicardial electrograms were recorded using two 64 electrode arrays directly opposing each other, placed on the right atrial wall in 5 patients with persistent AF. For all far-field deflections that could not be explained by local activation within the same plane, we searched for a passing wavefront on the other side of the atrial wall. 74±3% of detected far-field deflections could be explained by activation on the same side of the atrial wall. Within the remaining deflections, 42±5% had a source in the activity taking place directly on the other side of the atrial wall. 15±3% of all detected far-fields were of unknown origin. High proportion of the far-field deflections detected using contact mapping during AF results from endo-epicardial dissociation may have an impact on proper annotation of local activity, and therefore on identification of conduction patterns. Calculating the number of far-field deflections in unipolar electrograms due to endo-epi dissociation may help to quantitatively describe transmural dissociation.
Keywords :
"Electrodes","Area measurement"
Publisher :
ieee
Conference_Titel :
Computing in Cardiology Conference (CinC), 2015
ISSN :
2325-8861
Print_ISBN :
978-1-5090-0685-4
Electronic_ISBN :
2325-887X
Type :
conf
DOI :
10.1109/CIC.2015.7410956
Filename :
7410956
Link To Document :
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