• DocumentCode
    3748967
  • Title

    Far-field effect in unipolar electrograms recorded from epicardial and endocardial surface: Quantification of epi-endo dissociation during atrial Fibrillation in Humans

  • Author

    Piotr Podziemski;Stef Zeemering;Elham Bidar;Pawel Kuklik;Arne van Hunnik;Ulrich Schotten

  • Author_Institution
    Faculty of Physics, Warsaw University of Technology, Poland
  • fYear
    2015
  • Firstpage
    497
  • Lastpage
    500
  • Abstract
    In this study we explore whether endo-epicardial dissociation during atrial fibrillation (AF) can explain origin of some of the far-field components in unipolar electrograms. To assess the number of far-field deflections in unipolar electrograms that have a source on the contralateral side of the atrial wall we used simultaneous endo-epicardial high-resolution contact mapping. 30s endo-epicardial electrograms were recorded using two 64 electrode arrays directly opposing each other, placed on the right atrial wall in 5 patients with persistent AF. For all far-field deflections that could not be explained by local activation within the same plane, we searched for a passing wavefront on the other side of the atrial wall. 74±3% of detected far-field deflections could be explained by activation on the same side of the atrial wall. Within the remaining deflections, 42±5% had a source in the activity taking place directly on the other side of the atrial wall. 15±3% of all detected far-fields were of unknown origin. High proportion of the far-field deflections detected using contact mapping during AF results from endo-epicardial dissociation may have an impact on proper annotation of local activity, and therefore on identification of conduction patterns. Calculating the number of far-field deflections in unipolar electrograms due to endo-epi dissociation may help to quantitatively describe transmural dissociation.
  • Keywords
    "Electrodes","Area measurement"
  • Publisher
    ieee
  • Conference_Titel
    Computing in Cardiology Conference (CinC), 2015
  • ISSN
    2325-8861
  • Print_ISBN
    978-1-5090-0685-4
  • Electronic_ISBN
    2325-887X
  • Type

    conf

  • DOI
    10.1109/CIC.2015.7410956
  • Filename
    7410956