Title :
Investigation of using ferrite cores to control common mode impedance of cables for CISPR 22 conducted emissions measurements
Author :
Harlacher, Bruce L. ; Stewart, Richard W.
Author_Institution :
Fischer Custom Commun. Inc, San Diego, CA, USA
Abstract :
CISPR 22 (1997) defines the conducted emissions requirements and testing of Information Technology Equipment (ITE). Section C.1.4 of CISPR 22 requires measuring the common mode impedance of an ITE cable bundle with respect to its ground plane, and provides a test methodology for this measurement. Section C.1.4 indicates that the ITE cable bundle common mode impedance can be fixed at 150 ohms (+/- 20 ohms) by the positioning of ferrites along the cable between the EUT and the AE. Data is presented showing the measured common mode impedance of a simulated cable bundle as ferrite cores are moved along its length. Measurements are shown for core permeabilities of 125, 850, and 10000. The data show that common mode impedance control using ferrites is difficult, and may not be achievable for all frequencies over the intended emission frequency range of 150 kHz to 30 MHz. An example of a common mode impedance stabilization network is also provided which shows controlling the common mode impedance within CISPR 22 requirements for loads ranging from a short circuit to an open circuit
Keywords :
cables (electric); electric impedance measurement; electric noise measurement; electric variables control; electromagnetic interference; ferrite devices; information technology; magnetic cores; 150 kHz to 30 MHz; 150 ohm; CISPR 22; cable bundle common mode impedance; common mode impedance measurement; common mode impedance stabilization network; conducted emissions requirements; conducted emissions testing; core permeabilities; emission frequency range; ferrite cores; ground plane; information technology equipment; open circuit; short circuit; Circuits; Communication cables; Ferrites; Frequency; Impedance measurement; Information technology; Length measurement; Permeability measurement; Position measurement; Testing;
Conference_Titel :
Electromagnetic Compatibility, 2001. EMC. 2001 IEEE International Symposium on
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-6569-0
DOI :
10.1109/ISEMC.2001.950508