Title :
Kinetics of ionic migration and relaxation in anodic oxide films
Author :
V.P. Parkhutik;V.I. Shershulskij;V.A. Labunov
Author_Institution :
Minsk Radioengineering Inst., P.Brovki st. 6, 220069, USSR
fDate :
7/1/1983 12:00:00 AM
Abstract :
Anodic oxide films (AOF) grown on the surface of metals and semiconductors are widely used in various spheres of technology. Although such well-known features of AOF as space charge accumulation, electret effect, thermal instability etc. have attracted much research, their real nature is far from being clearly understood.
Keywords :
"Aging","Metals"
Conference_Titel :
Conduction and Breakdown in Solid Dielectrics, Proceedings of First International Conference on
DOI :
10.1109/ICSD.1983.7411479
