• DocumentCode
    374943
  • Title

    Strategies to improve confidence in immunity testing under CISPR24

  • Author

    Lachance, Joel ; Lawrence, Robert ; Stegner, Steve

  • Author_Institution
    Microsoft Corp., Redmond, WA, USA
  • Volume
    1
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    84
  • Abstract
    CISPR24 or its ratified harmonized version EN55024 documents procedures to assess the. performance of information technology equipment (ITE) while subjected to various continuous and transient, conducted and radiated disturbances such as electrostatic discharges (ESD) and electrical fast transient and burst (EFT/B). Basic EMC standards listed in CISPR24 have not proven to be highly repeatable and reproducible. Therefore this has made practical design decisions to improve ITE products performance to the standards difficult. This article presents strategies that can be used to increase the confidence in the EMC basic standards called in CISPR24. These strategies include: proper test planning, calibration and verification, repeatability and reproducibility studies, precise diagnostics and the application of a statistical process
  • Keywords
    calibration; electromagnetic compatibility; electromagnetic interference; electronic equipment testing; electrostatic discharge; standards; testing; transient analysis; CISPR24; EMC standards; EN55024; ESD; calibration; conducted disturbances; continuous disturbances; diagnostics; electrical fast transient and burst; electrostatic discharges; immunity testing; information technology equipment performance assessment; radiated disturbances; statistical process; test planning; test repeatability; test reproducibility; transient disturbances; verification; Calibration; Circuit testing; Electromagnetic compatibility; Electrostatic discharge; Immunity testing; Information technology; Process planning; Reproducibility of results; Software testing; Strategic planning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2001. EMC. 2001 IEEE International Symposium on
  • Conference_Location
    Montreal, Que.
  • Print_ISBN
    0-7803-6569-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2001.950543
  • Filename
    950543