Title :
Fluctuations as a basis for the Weibull statistics of dielectric breakdown
Author :
R. M. Hill;L. A. Dissado
Author_Institution :
The Dielectrics Group, Chelsea College, University of London, SW6 5PR, England
fDate :
7/1/1983 12:00:00 AM
Abstract :
A theoretical justification for the use of Weibull statistics in breakdown studies has been derived and has been applied to breakdown data on thin film samples. In general it has been found that the data for electrical breakdown in bulk samples is insufficient to allow a similar statistical analysis.
Conference_Titel :
Conduction and Breakdown in Solid Dielectrics, Proceedings of First International Conference on
DOI :
10.1109/ICSD.1983.7411522
