DocumentCode :
3749484
Title :
Computerized image analysis of dielectric breakdown phenomena in polyethylene
Author :
Joseph H. Groeger
Author_Institution :
Electrical Insulation Research Center, Institute of Materials Science, University of Connecticut, Storrs, 06268, USA
fYear :
1983
fDate :
7/1/1983 12:00:00 AM
Firstpage :
360
Lastpage :
363
Abstract :
Improvements in sample preparation methods are very important to the analysis of all the dielectric breakdown phenomena present in polyethylene insulated cables. Computerized image analysis affords a method of automatically scanning a sample to count trees, voids, and inclusions. This method is absolute whereas most other methods currently used rely on the measurement of small numbers of samples. Tree size distributions have been found to be very heavily weighted in the size range of 1 µm to 10 µm. This size range is commonly ignored with presently used staining and observation methods.
Keywords :
Computers
Publisher :
ieee
Conference_Titel :
Conduction and Breakdown in Solid Dielectrics, Proceedings of First International Conference on
Type :
conf
DOI :
10.1109/ICSD.1983.7411537
Filename :
7411537
Link To Document :
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