• DocumentCode
    3749484
  • Title

    Computerized image analysis of dielectric breakdown phenomena in polyethylene

  • Author

    Joseph H. Groeger

  • Author_Institution
    Electrical Insulation Research Center, Institute of Materials Science, University of Connecticut, Storrs, 06268, USA
  • fYear
    1983
  • fDate
    7/1/1983 12:00:00 AM
  • Firstpage
    360
  • Lastpage
    363
  • Abstract
    Improvements in sample preparation methods are very important to the analysis of all the dielectric breakdown phenomena present in polyethylene insulated cables. Computerized image analysis affords a method of automatically scanning a sample to count trees, voids, and inclusions. This method is absolute whereas most other methods currently used rely on the measurement of small numbers of samples. Tree size distributions have been found to be very heavily weighted in the size range of 1 µm to 10 µm. This size range is commonly ignored with presently used staining and observation methods.
  • Keywords
    Computers
  • Publisher
    ieee
  • Conference_Titel
    Conduction and Breakdown in Solid Dielectrics, Proceedings of First International Conference on
  • Type

    conf

  • DOI
    10.1109/ICSD.1983.7411537
  • Filename
    7411537