DocumentCode
3749484
Title
Computerized image analysis of dielectric breakdown phenomena in polyethylene
Author
Joseph H. Groeger
Author_Institution
Electrical Insulation Research Center, Institute of Materials Science, University of Connecticut, Storrs, 06268, USA
fYear
1983
fDate
7/1/1983 12:00:00 AM
Firstpage
360
Lastpage
363
Abstract
Improvements in sample preparation methods are very important to the analysis of all the dielectric breakdown phenomena present in polyethylene insulated cables. Computerized image analysis affords a method of automatically scanning a sample to count trees, voids, and inclusions. This method is absolute whereas most other methods currently used rely on the measurement of small numbers of samples. Tree size distributions have been found to be very heavily weighted in the size range of 1 µm to 10 µm. This size range is commonly ignored with presently used staining and observation methods.
Keywords
Computers
Publisher
ieee
Conference_Titel
Conduction and Breakdown in Solid Dielectrics, Proceedings of First International Conference on
Type
conf
DOI
10.1109/ICSD.1983.7411537
Filename
7411537
Link To Document