DocumentCode :
3749489
Title :
Examination of vented water tree microstructure using scanning transmission electron microscopy
Author :
R.D. Naybour
Author_Institution :
Electricity Council Research Centre, Capenhurst, Chester, England
fYear :
1983
fDate :
7/1/1983 12:00:00 AM
Firstpage :
380
Lastpage :
383
Abstract :
A previous report has been given of a series of life tests on XLPE insulated cables aged in water at stress levels from the service stress to 5 times service stress(1). This work showed that vented tree growth is stress and time dependent and that even though cables had been immersed in water at stress for as long as 11,000 hours there was still an incubation period of nearly 1000 hours before vented trees formed after a stress increase. This long term nucleation of vented trees is shown in Table 1.
Keywords :
"Stress","Aging","History","Dielectrophoresis"
Publisher :
ieee
Conference_Titel :
Conduction and Breakdown in Solid Dielectrics, Proceedings of First International Conference on
Type :
conf
DOI :
10.1109/ICSD.1983.7411542
Filename :
7411542
Link To Document :
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