DocumentCode :
3749630
Title :
Study of double-side Thru calibration kit by non-contact coupling structure
Author :
Hua-Jian Hsu;Meng-Hua Tu;Sung-Mao Wu;Cheng-Chang Chen
Author_Institution :
Micro Electronic Packaging Laboratory, Department of Electrical Engineering, National University of Kaohsiung, Taiwan
Volume :
1
fYear :
2015
Firstpage :
1
Lastpage :
3
Abstract :
In order to apply the non-contact coupling technology on double side measurement calibration, we design a high-efficient loop structure. The signal between two coils is transmitted by coupling. The reliable model is established in the paper, so we can get loss and radiation of coupling loop. The linearity and return loss are improved by the novel structure proposed in the study. By this paper, the calibration Thru kit applied by non-contact technology will be completed in the near future.
Keywords :
"Couplings","Calibration","Coils","Feeds","Capacitance","Reliability","Linearity"
Publisher :
ieee
Conference_Titel :
Microwave Conference (APMC), 2015 Asia-Pacific
Print_ISBN :
978-1-4799-8765-8
Type :
conf
DOI :
10.1109/APMC.2015.7411699
Filename :
7411699
Link To Document :
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