• DocumentCode
    3749630
  • Title

    Study of double-side Thru calibration kit by non-contact coupling structure

  • Author

    Hua-Jian Hsu;Meng-Hua Tu;Sung-Mao Wu;Cheng-Chang Chen

  • Author_Institution
    Micro Electronic Packaging Laboratory, Department of Electrical Engineering, National University of Kaohsiung, Taiwan
  • Volume
    1
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    In order to apply the non-contact coupling technology on double side measurement calibration, we design a high-efficient loop structure. The signal between two coils is transmitted by coupling. The reliable model is established in the paper, so we can get loss and radiation of coupling loop. The linearity and return loss are improved by the novel structure proposed in the study. By this paper, the calibration Thru kit applied by non-contact technology will be completed in the near future.
  • Keywords
    "Couplings","Calibration","Coils","Feeds","Capacitance","Reliability","Linearity"
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (APMC), 2015 Asia-Pacific
  • Print_ISBN
    978-1-4799-8765-8
  • Type

    conf

  • DOI
    10.1109/APMC.2015.7411699
  • Filename
    7411699