DocumentCode :
3749631
Title :
Non-exchanging structure calibration kit for double-side direct contact measurement
Author :
Han-Hsiang Shih;Meng-Hua Tu;Sung-Mao Wu
Author_Institution :
Micro Electronic Packaging Laboratory, Department of Electrical Engineering, National University of Kaohsiung, Taiwan
Volume :
1
fYear :
2015
Firstpage :
1
Lastpage :
3
Abstract :
In this paper, there is a novel double-side calibration thru kits which can be used in 4 ports By comparing different double-sided calibration, novel double-side calibration has better advantages. Therefore, novel double-side calibration is used in this paper. In novel double-side SOLT calibration, thru kit is the most important part. There are two types design about novel double-side thru kit, one is called the paralleled, the other is the diagonal. Finally, non-exchanged layer structure to achieve what we design.
Keywords :
"Calibration","Microwave technology","Decision support systems","Coplanar waveguides","Indexes","Delays"
Publisher :
ieee
Conference_Titel :
Microwave Conference (APMC), 2015 Asia-Pacific
Print_ISBN :
978-1-4799-8765-8
Type :
conf
DOI :
10.1109/APMC.2015.7411700
Filename :
7411700
Link To Document :
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