A real-time simultaneous switching noise analysis by near-field measurement system for BGA package

In nowadays, signal and power integrity are crucial for ensuring good performance in high speed digital systems. As the operating frequency increases, the power and ground bounce created by simultaneous switching noise (SSN) becomes a limiting factor for the performance. In order to analyze these effects, this paper provides a way of directly measuring a radiating integrated circuit. With the system of measurement, the radiation of integrated circuit in one microsecond can be observed, and make a video of three-dimensional radiating field. It is found that we can directly analyze the influence of SSN on the different DUT and a unusual resonance created by SSN. Thus, we are able to observe those phenomenon, instead of using simulations to predict.