• DocumentCode
    3749920
  • Title

    High-rate CMP process for large PCB by controlling platen coolant temperature

  • Author

    Minjong Yuh;Haedo Jeong;Hyoungjae Kim

  • Author_Institution
    Graduate school of mechanical engineering, Pusan National University, Busan, Republic of Korea
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    In printed-circuit-board (PCB) manufacturing process, Chemical mechanical polishing (CMP) is currently replacing conventional chemical etching or mechanical polishing to remove overburdened copper deposit owing to its ability to realize a global planarization. This paper introduces newly developed Oscar-type CMP machine and copper CMP process to polish rectangular PCB with a size up to 510 mm by 510 mm. The effect of platen coolant temperature on removal rate and removal uniformity during copper CMP is studied to achieve high-rate Cu removal.
  • Keywords
    "Coolants","Slurries","Size measurement","Probes"
  • Publisher
    ieee
  • Conference_Titel
    Planarization/CMP Technology (ICPT), 2015 International Conference on
  • Type

    conf

  • Filename
    7412018