DocumentCode
3749920
Title
High-rate CMP process for large PCB by controlling platen coolant temperature
Author
Minjong Yuh;Haedo Jeong;Hyoungjae Kim
Author_Institution
Graduate school of mechanical engineering, Pusan National University, Busan, Republic of Korea
fYear
2015
Firstpage
1
Lastpage
3
Abstract
In printed-circuit-board (PCB) manufacturing process, Chemical mechanical polishing (CMP) is currently replacing conventional chemical etching or mechanical polishing to remove overburdened copper deposit owing to its ability to realize a global planarization. This paper introduces newly developed Oscar-type CMP machine and copper CMP process to polish rectangular PCB with a size up to 510 mm by 510 mm. The effect of platen coolant temperature on removal rate and removal uniformity during copper CMP is studied to achieve high-rate Cu removal.
Keywords
"Coolants","Slurries","Size measurement","Probes"
Publisher
ieee
Conference_Titel
Planarization/CMP Technology (ICPT), 2015 International Conference on
Type
conf
Filename
7412018
Link To Document