DocumentCode
3750169
Title
A study balancing physical properties for an optimized thermal interface material
Author
Lyndon Larson;Xiao Dong Wang;Yin Tang;Adriana Zambova
Author_Institution
Dow Corning Corporation, 2200 W. Salzburg Road, Midland MI 48686-0994
fYear
2015
Firstpage
1
Lastpage
5
Abstract
Thermal dissipation requirements for advanced flip chip devices are becoming significant. High end flip chip devices that used lidded packages are now being redesigned to utilize even more advanced materials. Devices that previously did not require a lidded package are now being forced to utilize such a package. The latter scenario can also can benefit from more advanced materials. Initial thermal performance is a key factor for selecting a candidate thermal interface material (TIM), but how well the package can survive reliability conditions is also important. Cost pressures on the overall structural design can also be a significant factor for some types of applications. Polymeric TIMs can address many of these issues by having a high initial thermal performance and by allowing adequate mechanical stress relief to survive reliability conditions. The TIM properties, such as elongation and modulus can be as important as the thermal conductivity. Properties such as thermal resistance and thermal impedance are even more important. This paper will detail how these properties are inter-related and will demonstrate that an optimum balance between them can be achieved.
Keywords
"Thermal conductivity","Seals","Performance evaluation","Testing","Flip-chip devices","Reliability","Polymers"
Publisher
ieee
Conference_Titel
Electronics Packaging and Technology Conference (EPTC), 2015 IEEE 17th
Type
conf
DOI
10.1109/EPTC.2015.7412273
Filename
7412273
Link To Document