• DocumentCode
    3750200
  • Title

    Interfacial reaction and reliability of high temperature die attach solders for power electronics

  • Author

    Lee Jong Bum;Hwang How Yuan;Pan Wei Chih;Rhee Min Woo Daniel

  • Author_Institution
    Institute of Microelectronics, A?STAR (Agency for Science, Technology and Research) 11 Science Park Rd, Singapore Science Park II, Singapore 117685
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Lead-free solder alloys for high temperature applications is required to meet increasing demands for reliable replacements for lead-based alloys. Especially, high temperature solder is required for bonding in power electronics packages where first bonding on a lead-frame is performed at a temperature of about 330 °C. In this study, the SiC based TO-220 power package was developed by applying high temperature endurable material sets which can endure over 220°C device junction temperature. The interfacial reaction and reliability of SiC die attachment on and Ni plated lead frames using Zn-Al based solder was investigated. Zn-Al-Ge solder alloy showed good temperature tolerance after temperature cycle (TC), high temperature storage test whereas Zn-Al-Ge-Mg solder alloy showed failures after TC test.
  • Keywords
    "High-temperature superconductors","Image edge detection","Reliability","Lead","Silicon carbide","Bonding"
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging and Technology Conference (EPTC), 2015 IEEE 17th
  • Type

    conf

  • DOI
    10.1109/EPTC.2015.7412304
  • Filename
    7412304