• DocumentCode
    3750203
  • Title

    Study on power cycling reliability of power module with single metal layer flexible substrate by finite element analysis

  • Author

    Zhaohui Chen;How Yuan Hwang;Norhanani Jaafar;Daniel Min Woo Rhee

  • Author_Institution
    Institute of Microelectronics, A?STAR (Agency for Science, Technology and Research), 11 Science Park Road, Singapore Science Park II, 117685
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    In this paper, the power cycling simulation model was built up to study the thermo-mechanical reliability of the power electronic package test vehicle with single metal layer flexible substrate. The power cycling simulation includes thermal analysis and thermo-mechanical analysis. The temperature distribution of the high power electronic package was obtained by the thermal analysis. The stress and strain behaviors of the die attach materials and Al bonding wires of the power electronic package were investigated by the coupled thermo-mechanical simulation. The fatigue lives of the die attach materials and Al bonding wires were estimated by the plastic-strain based Coffin-Manson fatigue life prediction model. The effects of the die materials, epoxy molding compound (EMC) and die attach materials were also investigated by the parametric studies with the numerical simulation results.
  • Keywords
    "Power electronics","Wires","Silicon carbide","Electronic packaging thermal management","Thermomechanical processes","Microassembly","Mathematical model"
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging and Technology Conference (EPTC), 2015 IEEE 17th
  • Type

    conf

  • DOI
    10.1109/EPTC.2015.7412307
  • Filename
    7412307