Title :
Impact of different developer concentrations for advanced packaging photolithography
Author :
Serine Soh Siew Boon;Sek Soon Ann;King Jien Chui;Mingbin Yu
Author_Institution :
Institute of Microelectronics, A?STAR (Agency of Science, Technology and Research) 11 Science Park Road, Singapore Science Park2, Singapore 117685
Abstract :
Enhancement of developing effect with Tetramethylammonium hydroxide (TMAH) of different concentration beneficially enhances the contour effect of Photo-resist (PR) after development. Tetramethylammonium hydroxide (TMAH) of different concentration is used to evaluate the developing effect on different photo-resist with different thicknesses and critical dimensions. Fabricated with similar patterned wafers; wall profiles and thickness measurement were compared at post development. Volume of developer applied denotes the reduction in chemical consumption and cycle time reduction.
Keywords :
"Thickness measurement","Lithography","Productivity","Chemicals","Resists","Coatings","Dielectrics"
Conference_Titel :
Electronics Packaging and Technology Conference (EPTC), 2015 IEEE 17th
DOI :
10.1109/EPTC.2015.7412364