DocumentCode :
3750270
Title :
3D package failure analysis challenge and solution
Author :
Fu Chao;Li Xiaomin;Justin Kow
Author_Institution :
WinTech Nano-Technology Services Pte. Ltd.
fYear :
2015
Firstpage :
1
Lastpage :
4
Abstract :
3D packaging with complex multi die and multi component structure has new Failure Analysis challenges in electrical testing, package fault isolation and physical failure analysis. This paper emphasize on new approach using 3D X-Ray other techniques.
Keywords :
"Three-dimensional displays","X-ray imaging","Failure analysis","Silicon","Image reconstruction","Electronics packaging","Metals"
Publisher :
ieee
Conference_Titel :
Electronics Packaging and Technology Conference (EPTC), 2015 IEEE 17th
Type :
conf
DOI :
10.1109/EPTC.2015.7412374
Filename :
7412374
Link To Document :
بازگشت