Title :
3D package failure analysis challenge and solution
Author :
Fu Chao;Li Xiaomin;Justin Kow
Author_Institution :
WinTech Nano-Technology Services Pte. Ltd.
Abstract :
3D packaging with complex multi die and multi component structure has new Failure Analysis challenges in electrical testing, package fault isolation and physical failure analysis. This paper emphasize on new approach using 3D X-Ray other techniques.
Keywords :
"Three-dimensional displays","X-ray imaging","Failure analysis","Silicon","Image reconstruction","Electronics packaging","Metals"
Conference_Titel :
Electronics Packaging and Technology Conference (EPTC), 2015 IEEE 17th
DOI :
10.1109/EPTC.2015.7412374