• DocumentCode
    3750289
  • Title

    Investigation of vertical interposers for high frequency operation

  • Author

    Wei Yi Lim;Ka Fai Chang;M. Kumarasamy Raja;Seow Meng Low;Jason Goh;M. Annamalai Arasu

  • Author_Institution
    Institute of Microelectronics, Agency for Science, Technology and Research (A?Star), 11 Science park Road, Singapore Science Park II, Singapore 117685
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Horizontal probe station poses challenges in determining performance of vertical interposers for test socket. In this paper, a PCB test structure has been proposed for measurement of our designed interposers up to 20 GHz. A new test structure is further proposed and simulated with HFSS to achieve a higher operating frequency. By converting the S-parameters of test structures to T-parameters and splitting of cascaded blocks using optimization method, the performance of an individual vertical interposer can be obtained.
  • Keywords
    "Scattering parameters","Probes","Optimization methods","Periodic structures","Sockets","Electronics packaging","Frequency measurement"
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging and Technology Conference (EPTC), 2015 IEEE 17th
  • Type

    conf

  • DOI
    10.1109/EPTC.2015.7412393
  • Filename
    7412393