• DocumentCode
    3750917
  • Title

    A leakage tolerant true single-phase clock dual-modulus prescaler scheme

  • Author

    Song Jia;Ziyi Wang;Shilin Yan;Yuan Wang

  • Author_Institution
    Key Laboratory of Microelectronic Devices and Circuits, Institute of Microelectronics, Peking University, 100871 Beijing, China
  • Volume
    3
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    A new leakage-tolerant true single-phase clock dual-modulus prescaler based on a stage-merged scheme is presented. Leakage-restricting transistors are used to reduce the leakage currents at critical nodes and leakage-related malfunctions are eliminated at minimal cost in terms of speed, power and area overheads. An HSPICE simulation in a 40 nm process shows that the proposed divide-by-2/3 divider can effectively enhance robustness against leakage currents to extend the low frequency limit of the circuit over wide temperature and threshold voltage ranges. Additionally, the proposed design shows speed and power performance that is comparable to the performance levels of referenced designs.
  • Keywords
    "Leakage currents","Transistors","Performance evaluation","Clocks","Phase locked loops","Robustness","Frequency conversion"
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (APMC), 2015 Asia-Pacific
  • Print_ISBN
    978-1-4799-8765-8
  • Type

    conf

  • DOI
    10.1109/APMC.2015.7413500
  • Filename
    7413500