DocumentCode
3750917
Title
A leakage tolerant true single-phase clock dual-modulus prescaler scheme
Author
Song Jia;Ziyi Wang;Shilin Yan;Yuan Wang
Author_Institution
Key Laboratory of Microelectronic Devices and Circuits, Institute of Microelectronics, Peking University, 100871 Beijing, China
Volume
3
fYear
2015
Firstpage
1
Lastpage
3
Abstract
A new leakage-tolerant true single-phase clock dual-modulus prescaler based on a stage-merged scheme is presented. Leakage-restricting transistors are used to reduce the leakage currents at critical nodes and leakage-related malfunctions are eliminated at minimal cost in terms of speed, power and area overheads. An HSPICE simulation in a 40 nm process shows that the proposed divide-by-2/3 divider can effectively enhance robustness against leakage currents to extend the low frequency limit of the circuit over wide temperature and threshold voltage ranges. Additionally, the proposed design shows speed and power performance that is comparable to the performance levels of referenced designs.
Keywords
"Leakage currents","Transistors","Performance evaluation","Clocks","Phase locked loops","Robustness","Frequency conversion"
Publisher
ieee
Conference_Titel
Microwave Conference (APMC), 2015 Asia-Pacific
Print_ISBN
978-1-4799-8765-8
Type
conf
DOI
10.1109/APMC.2015.7413500
Filename
7413500
Link To Document