DocumentCode :
3752759
Title :
Application-specific memory protection policies for energy-efficient reliable design
Author :
Sheng Yang;Rishad A. Shafik;Saqib Khursheed;David Flynn;Geoff V. Merrett;Bashir M. Al-hashimi
Author_Institution :
Uni. Southampton, UK
fYear :
2015
Firstpage :
18
Lastpage :
24
Abstract :
In this paper, we show that the vulnerability of memory components due to data retention in the presence of soft errors exhibit orders of magnitude variations with applications through extensive analysis of MiBench benchmarks. Underpinning such analysis, we propose a novel application-specific design flow for joint energy efficiency and reliability optimization. The energy efficiency is achieved through voltage/frequency scaling (VFS), while reliability is achieved through suitably choosing the appropriate protection policies (L1-Cache resizing and selective ECC) for hierarchical memory components. Fundamental to such joint optimization is a design analysis framework, which can analyze trade-off between memory protection policies considering the impact of VFS, and apply design optimization algorithm to provide with an energy-efficient design, while meeting a given reliability target. Using this framework the proposed design flow is validated through extensive number of application case studies based on ARMv7 processors modeled in GEM5. We show that the joint consideration of cache resizing and VFS can improve the L1-Cache reliability by up to 5x compared to VFS alone, while incurring <;10% energy overhead. Additionally, using selective ECC for L2-Cache and DRAM, we show that energy consumption can be reduced by up to 40%.
Keywords :
"Random access memory","Reliability engineering","Program processors","Benchmark testing","Error correction codes","Monitoring"
Publisher :
ieee
Conference_Titel :
Rapid System Prototyping (RSP), 2015 International Symposium on
Electronic_ISBN :
2150-5519
Type :
conf
DOI :
10.1109/RSP.2015.7416541
Filename :
7416541
Link To Document :
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