DocumentCode :
375278
Title :
Multi-generation diffusion model for economic assessment of new technology
Author :
Young Soh, So ; Joo Ahn, Byung
Author_Institution :
Dept. of Comput. Sci. & Ind. Syst. Eng., Yonsei Univ., Seoul, South Korea
Volume :
1
fYear :
2001
fDate :
2001
Abstract :
Summary form only given. In the 21st century, development of emerging information technology is the essence of advancement. This kind of new technology, however, often requires a great deal of amount of initial investment for both procedures of R&D and commercialization. As cost invested in developing the specified technology is increasing, investors are paying more attention to cost benefit analysis (CBA). One of the basic elements of CBA for new technological development is the diffusion pattern of demand of such technology. In this paper, we show how multi-generation technology diffusion model can be applied for more accurate CBA for information technology. Additionally, Monte Carlo simulation is performed to find influential factors on the CBA of a cybernetic building system. As a result of employing the multi-generation model instead of the single generation diffusion, more conservative decision can be made in terms of the value/benefit of the new technology
Keywords :
Monte Carlo methods; cost-benefit analysis; economics; Monte Carlo simulation; R&D; commercialization; cost benefit analysis; cybernetic building system; information technology; initial investment; multi-generation diffusion model; new technology economic assessment; technology diffusion model; Commercialization; Computer industry; Computer science; Cost benefit analysis; Cybernetics; Information technology; Investments; Modeling; Research and development; Systems engineering and theory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Management of Engineering and Technology, 2001. PICMET '01. Portland International Conference on
Conference_Location :
Portland, OR
Print_ISBN :
1-890843-06-7
Type :
conf
DOI :
10.1109/PICMET.2001.952132
Filename :
952132
Link To Document :
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