DocumentCode
375488
Title
Stability analysis of multiple-feedback oversampled Σ-Δ A/D converter configurations
Author
Fraser, Neil A. ; Nowrouzian, Behrouz
Author_Institution
Dept. of Electr. & Comput. Eng., Alberta Univ., Edmonton, Alta., Canada
Volume
2
fYear
2000
fDate
2000
Firstpage
676
Abstract
This paper is concerned with the estimation of the maximum DC input signal level for five different practical feedforward and multiple-feedback oversampled Σ-Δ A/D converters. This technique is based on replacing the constituent quantizer by a uniformly distributed additive white noise source and a variable gain element, assuming the following conditions are satisfied: a) the quantizer input signal and quantization error are uncorrelated, b) the quantizer input signal is Gaussian distributed, and c) the quantization noise is white. It is shown that the statistical estimation technique is quite accurate for Σ-Δ A/D converters with small noise power gains, but that the accuracy tends to decrease for A/D converters having larger noise power gains. It is further shown that this reduction in accuracy stems from the fact that the assumptions listed under a), b), and c) are not exactly satisfied. It is finally shown that the probability density function of the input signal to the quantizer may be modelled more accurately using the Gram-Charlier series
Keywords
Gaussian distribution; circuit feedback; circuit noise; circuit stability; quantisation (signal); sigma-delta modulation; white noise; DC input signal level; Gaussian distribution; Gram-Charlier series; additive white noise source; multiple-feedback oversampled sigma-delta A/D converter; noise power gain; probability density function; quantization error; quantizer; stability analysis; statistical estimation; variable gain element; Additive white noise; Amplitude estimation; Capacitors; Feedback; Gain; Gaussian noise; Quantization; Signal processing; Stability analysis; Transfer functions;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2000. Proceedings of the 43rd IEEE Midwest Symposium on
Conference_Location
Lansing, MI
Print_ISBN
0-7803-6475-9
Type
conf
DOI
10.1109/MWSCAS.2000.952847
Filename
952847
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