Title :
Numerical investigation of metrics for epidemic processes on graphs
Author :
Max Goering;Nathan Albin;Pietro Poggi-Corradini;Caterina Scoglio;Faryad Darabi Sahneh
Author_Institution :
Department of Mathematics, Kansas State University, Manhattan, KS 66506
Abstract :
This study develops the epidemic hitting time (EHT) metric on graphs measuring the expected time an epidemic starting at node a in a fully susceptible network takes to propagate and reach node b. An associated EHT centrality measure is then compared to degree, betweenness, spectral, and effective resistance centrality measures through exhaustive numerical simulations on several real-world network data-sets. We find two surprising observations: first, EHT centrality is highly correlated with effective resistance centrality; second, the EHT centrality measure is much more delocalized compared to degree and spectral centrality, highlighting the role of peripheral nodes in epidemic spreading on graphs.
Keywords :
"Resistance","Silicon","Electrical resistance measurement","Markov processes","Laplace equations","Xenon"
Conference_Titel :
Signals, Systems and Computers, 2015 49th Asilomar Conference on
Electronic_ISBN :
1058-6393
DOI :
10.1109/ACSSC.2015.7421356