Title :
TWiN: A Turn-Guided Reliable Routing Scheme for Wireless 3D NoCs
Author :
Jun Zhou;Huawei Li;Tiancheng Wang;Sen Li;Ying Wang;Xiaowei Li
Author_Institution :
State Key Lab. of Comput. Archit., Inst. of Comput. Technol., Beijing, China
Abstract :
Network-on-chip (NoC) is a major communication technique for 3D integrated circuits (ICs). In order to achieve higher throughput and lower latency with less system cost, horizontal and vertical wireless links are adopted to apply in the 3D NoCs. So far, the reliable routing scheme has been regarded as a lightweight and high-efficiency mechanism to guarantee the performance of the faulty 2D/3D NoCs. In this paper, we propose a low-overhead turn-guided reliable routing scheme named TWiN for the vertical link faults in wireless 3D NoCs. TWiN is deadlock-free without any virtual channels (VCs). Experimental results show that TWiN possesses higher performance, improved reliability and lower overhead compared with the state-of-the-art reliable routing scheme for wireless 3D NoCs.
Keywords :
"Wireless communication","Three-dimensional displays","Reliability","Routing","Couplings","Circuit faults","Transceivers"
Conference_Titel :
Test Symposium (ATS), 2015 IEEE 24th Asian
Electronic_ISBN :
2377-5386
DOI :
10.1109/ATS.2015.22