• DocumentCode
    3756066
  • Title

    TWiN: A Turn-Guided Reliable Routing Scheme for Wireless 3D NoCs

  • Author

    Jun Zhou;Huawei Li;Tiancheng Wang;Sen Li;Ying Wang;Xiaowei Li

  • Author_Institution
    State Key Lab. of Comput. Archit., Inst. of Comput. Technol., Beijing, China
  • fYear
    2015
  • Firstpage
    85
  • Lastpage
    90
  • Abstract
    Network-on-chip (NoC) is a major communication technique for 3D integrated circuits (ICs). In order to achieve higher throughput and lower latency with less system cost, horizontal and vertical wireless links are adopted to apply in the 3D NoCs. So far, the reliable routing scheme has been regarded as a lightweight and high-efficiency mechanism to guarantee the performance of the faulty 2D/3D NoCs. In this paper, we propose a low-overhead turn-guided reliable routing scheme named TWiN for the vertical link faults in wireless 3D NoCs. TWiN is deadlock-free without any virtual channels (VCs). Experimental results show that TWiN possesses higher performance, improved reliability and lower overhead compared with the state-of-the-art reliable routing scheme for wireless 3D NoCs.
  • Keywords
    "Wireless communication","Three-dimensional displays","Reliability","Routing","Couplings","Circuit faults","Transceivers"
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ATS), 2015 IEEE 24th Asian
  • Electronic_ISBN
    2377-5386
  • Type

    conf

  • DOI
    10.1109/ATS.2015.22
  • Filename
    7422240