DocumentCode
3756066
Title
TWiN: A Turn-Guided Reliable Routing Scheme for Wireless 3D NoCs
Author
Jun Zhou;Huawei Li;Tiancheng Wang;Sen Li;Ying Wang;Xiaowei Li
Author_Institution
State Key Lab. of Comput. Archit., Inst. of Comput. Technol., Beijing, China
fYear
2015
Firstpage
85
Lastpage
90
Abstract
Network-on-chip (NoC) is a major communication technique for 3D integrated circuits (ICs). In order to achieve higher throughput and lower latency with less system cost, horizontal and vertical wireless links are adopted to apply in the 3D NoCs. So far, the reliable routing scheme has been regarded as a lightweight and high-efficiency mechanism to guarantee the performance of the faulty 2D/3D NoCs. In this paper, we propose a low-overhead turn-guided reliable routing scheme named TWiN for the vertical link faults in wireless 3D NoCs. TWiN is deadlock-free without any virtual channels (VCs). Experimental results show that TWiN possesses higher performance, improved reliability and lower overhead compared with the state-of-the-art reliable routing scheme for wireless 3D NoCs.
Keywords
"Wireless communication","Three-dimensional displays","Reliability","Routing","Couplings","Circuit faults","Transceivers"
Publisher
ieee
Conference_Titel
Test Symposium (ATS), 2015 IEEE 24th Asian
Electronic_ISBN
2377-5386
Type
conf
DOI
10.1109/ATS.2015.22
Filename
7422240
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