DocumentCode :
3756067
Title :
Securing IEEE 1687-2014 Standard Instrumentation Access by LFSR Key
Author :
Hejia Liu;Vishwani D. Agrawal
Author_Institution :
ECE Dept., Auburn Univ., Auburn, AL, USA
fYear :
2015
Firstpage :
91
Lastpage :
96
Abstract :
IEEE 1687-2014 Standard provides an effective method for accessing on-chip instruments for testing, debugging and board configuration. The standard, however, causes a safety problem because anyone can access the chip instruments, set inputs and obtain safety critical information. In recent work, a lock in the segment insertion bit (SIB) and a corresponding unlocking key application procedure have been proposed for securing the 1687. This paper provides a linear feedback shift register (LFSR) based key generation mechanism that enhances the security of 1687 very significantly. By reconfiguring m (a small number) scan flip-flops into an LFSR that generates the key to unlock the SIB, we show a substantial increase in the expected break-in time.
Keywords :
"Instruments","Standards","Security","Clocks","Logic gates","Built-in self-test"
Publisher :
ieee
Conference_Titel :
Test Symposium (ATS), 2015 IEEE 24th Asian
Electronic_ISBN :
2377-5386
Type :
conf
DOI :
10.1109/ATS.2015.23
Filename :
7422241
Link To Document :
بازگشت