Title :
Modular architecture for statistical signal parameter measurement using multi-bit random-data representation
Author :
Petriu, Emil M. ; Al-Dhaher, Abdul ; Zhao, Lichen ; Dostaler, Marc
Author_Institution :
Sch. of Inf. Technol. & Eng., Ottawa Univ., Ont., Canada
Abstract :
Generalizing von Neumans binary random-pulse machine concept, the paper discusses the multi-bit random-data representation and shows how it can be used for a modular instrumentation architecture for the measurement of first and second order statistical signal parameter measurements
Keywords :
VLSI; correlators; covariance analysis; neural chips; quantisation (signal); random functions; VLSI; circuit complexity; modular architecture; multi-bit random-data representation; packing density; pulse stream techniques; statistical signal parameter measurement; von Neumans binary random-pulse machine concept; Arithmetic; DH-HEMTs; Digital signal processing; Information technology; Instruments; Quantization; Random sequences; Signal resolution; Tellurium; Virtual reality;
Conference_Titel :
Communications, Computers and signal Processing, 2001. PACRIM. 2001 IEEE Pacific Rim Conference on
Conference_Location :
Victoria, BC
Print_ISBN :
0-7803-7080-5
DOI :
10.1109/PACRIM.2001.953581
