DocumentCode :
375713
Title :
Frequency/time-domain modeling of microstrip circuits by a modified spectral domain approach
Author :
Arcioni, P. ; Bressan, M. ; Conciauro, G.
Author_Institution :
Dipt. di Elettronica, Pavia Univ., Italy
Volume :
2
fYear :
2001
fDate :
20-24 May 2001
Firstpage :
1237
Abstract :
This paper shortly describes a novel full-wave approach to the analysis of boxed planar passive MMICs. The analysis takes into account both the losses in the substrate and in the metallization. Like in the standard SDA the analysis is performed by applying the Method of Moments (MoM) in the spectral domain, but the standard algorithm is modified according to the philosophy of the Boundary-Integral Resonant-Mode-Expansion (BIRME) method. Like in frequency-time domain modeling based on finite difference or finite element methods, this modification lends itself to obtaining the pole expansion of the admittance matrix in the s-plane by solving a linear matrix eigenvalue problem. With respect to finite methods, the implementation of the integral approach described in this paper results in much shorter computer times and requires much smaller memory resources. An example demonstrates the advantage of the method.
Keywords :
MMIC; boundary integral equations; eigenvalues and eigenfunctions; losses; matrix algebra; method of moments; microstrip circuits; passive networks; spectral-domain analysis; time-frequency analysis; admittance matrix; boundary-integral resonant-mode-expansion method; boxed planar passive MMICs; frequency/time-domain modeling; full-wave approach; linear matrix eigenvalue problem; metallization losses; method of moments; microstrip circuits; modified spectral domain approach; pole expansion; s-plane; spectral domain; substrate losses; Algorithm design and analysis; Circuits; Frequency; MMICs; Metallization; Microstrip; Moment methods; Performance analysis; Time domain analysis; Transmission line matrix methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2001 IEEE MTT-S International
Conference_Location :
Phoenix, AZ, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-6538-0
Type :
conf
DOI :
10.1109/MWSYM.2001.967116
Filename :
967116
Link To Document :
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