• DocumentCode
    3757594
  • Title

    A Review of On-Chip Spectral Analysis for Built-In Testing Using FFT Engine

  • Author

    Manjiri L. Karandikar;Snehprabha Lad

  • Author_Institution
    Microelectron. &
  • fYear
    2015
  • Firstpage
    7
  • Lastpage
    9
  • Abstract
    On chip Built in testing of electronic equipment is very much necessary because customers are demanding more value for their money spent on electronic gadgets. The accurate and efficient analysis requires use of a very precise hardware and software. Also full understanding of test signals and system is required to perform spectrum analysis. FFT (Fast Fourier Transform algorithm) is the technique which is used to perform built in test and calibration with the help of test signals with certain inter modulation component and harmonic component. In this paper we have reviewed advancements in on chip testing algorithms using FFT as a test engine.
  • Keywords
    "OFDM","Testing","Algorithm design and analysis","Discrete Fourier transforms","Signal processing algorithms","System-on-chip","Spectral analysis"
  • Publisher
    ieee
  • Conference_Titel
    Emerging Trends in Engineering and Technology (ICETET), 2015 7th International Conference on
  • Electronic_ISBN
    2157-0485
  • Type

    conf

  • DOI
    10.1109/ICETET.2015.17
  • Filename
    7425572