DocumentCode
3757594
Title
A Review of On-Chip Spectral Analysis for Built-In Testing Using FFT Engine
Author
Manjiri L. Karandikar;Snehprabha Lad
Author_Institution
Microelectron. &
fYear
2015
Firstpage
7
Lastpage
9
Abstract
On chip Built in testing of electronic equipment is very much necessary because customers are demanding more value for their money spent on electronic gadgets. The accurate and efficient analysis requires use of a very precise hardware and software. Also full understanding of test signals and system is required to perform spectrum analysis. FFT (Fast Fourier Transform algorithm) is the technique which is used to perform built in test and calibration with the help of test signals with certain inter modulation component and harmonic component. In this paper we have reviewed advancements in on chip testing algorithms using FFT as a test engine.
Keywords
"OFDM","Testing","Algorithm design and analysis","Discrete Fourier transforms","Signal processing algorithms","System-on-chip","Spectral analysis"
Publisher
ieee
Conference_Titel
Emerging Trends in Engineering and Technology (ICETET), 2015 7th International Conference on
Electronic_ISBN
2157-0485
Type
conf
DOI
10.1109/ICETET.2015.17
Filename
7425572
Link To Document