Title :
EM Injection: Fault Model and Locality
Author :
S. Ordas;L. Guillaume-Sage;Philippe Maurine
Author_Institution :
LIRMM, Univ. of Montpellier, Montpellier, France
Abstract :
EM injection recently emerged as an effective medium for fault injection. This paper presents an analysis of the IC susceptibility to EM pulses. It highlights that faults produced by EM pulse injection are not timing faults but correspond to a different model which is presented in this paper. This model also allows to explain experimental results introduced in former communications.
Keywords :
"Circuit faults","Timing","Clocks","Generators","Time factors","Integrated circuit modeling"
Conference_Titel :
Fault Diagnosis and Tolerance in Cryptography (FDTC), 2015 Workshop on
DOI :
10.1109/FDTC.2015.9
