DocumentCode
3758223
Title
Characterisation of 10 kV 10 A SiC MOSFET
Author
Emanuel-Petre Eni;Bogdan Ioan Incau;Tamas Kerekes;Remus Teodorescu;Stig Munk-Nielsen
Author_Institution
Department of Energy Technology, Aalborg University, Denmark
fYear
2015
Firstpage
675
Lastpage
680
Abstract
The objective of this paper is to characterize and evaluate the static and dynamic performances of 10 kV 10 A 4H-SIC MOSFETs at high temperatures. The results show good electrical performances of the SiC MOSFETs for high temperature operations. The double-pulse test results showed interesting behavior at elevated temperatures, where at turn-on the switching speeds become faster, thus turn-on losses become smaller, and opposite at turn-off.
Keywords
"Silicon carbide","Logic gates","Temperature measurement","MOSFET","Temperature","Voltage measurement","Silicon"
Publisher
ieee
Conference_Titel
Electrical Machines & Power Electronics (ACEMP), 2015 Intl Conference on Optimization of Electrical & Electronic Equipment (OPTIM) & 2015 Intl Symposium on Advanced Electromechanical Motion Systems (ELECTROMOTION), 2015 Intl Aegean Conference on
Type
conf
DOI
10.1109/OPTIM.2015.7427016
Filename
7427016
Link To Document