• DocumentCode
    3759802
  • Title

    Time and energy measurement ASIC for microstrip detectors with two-level reset system based on the Time-over-Threshold technique

  • Author

    Krzysztof Kasinski;Rafal Kleczek

  • Author_Institution
    Department of Measurement and Electronics, AGH University of Science and Technology, Cracow, Poland
  • fYear
    2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    A low-power, low-noise charge and time measurement while working with semiconductor sensors is an important research topic. Time-over-Threshold method has proven its value as a low-power charge measurement solution for pixel sensors. For microstrip sensors however, where shapers are often used, obtaining a linear transfer characteristics is a challenging task. This paper presents the measurement results of a prototype multichannel integrated circuit based on a recently proposed variant of the Time-over-Threshold (ToT) technique using two-stage processing and two-level reset system. The circuit is designed for semiconductor microstrip sensors with the capacitance of tens of pF and input charges range of min. 0-10 fC where linear transfer characteristic (INL <; 1%) is favorable together with low power consumption (<;4 mW/channel) and high input charge rates (> 1 MHz for Qin ~ 2 fC).
  • Keywords
    "Application specific integrated circuits","Charge measurement","Time measurement","Semiconductor device measurement","Sensor phenomena and characterization","Microstrip"
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2014 IEEE
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2014.7431035
  • Filename
    7431035