DocumentCode :
3759802
Title :
Time and energy measurement ASIC for microstrip detectors with two-level reset system based on the Time-over-Threshold technique
Author :
Krzysztof Kasinski;Rafal Kleczek
Author_Institution :
Department of Measurement and Electronics, AGH University of Science and Technology, Cracow, Poland
fYear :
2014
Firstpage :
1
Lastpage :
6
Abstract :
A low-power, low-noise charge and time measurement while working with semiconductor sensors is an important research topic. Time-over-Threshold method has proven its value as a low-power charge measurement solution for pixel sensors. For microstrip sensors however, where shapers are often used, obtaining a linear transfer characteristics is a challenging task. This paper presents the measurement results of a prototype multichannel integrated circuit based on a recently proposed variant of the Time-over-Threshold (ToT) technique using two-stage processing and two-level reset system. The circuit is designed for semiconductor microstrip sensors with the capacitance of tens of pF and input charges range of min. 0-10 fC where linear transfer characteristic (INL <; 1%) is favorable together with low power consumption (<;4 mW/channel) and high input charge rates (> 1 MHz for Qin ~ 2 fC).
Keywords :
"Application specific integrated circuits","Charge measurement","Time measurement","Semiconductor device measurement","Sensor phenomena and characterization","Microstrip"
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2014 IEEE
Type :
conf
DOI :
10.1109/NSSMIC.2014.7431035
Filename :
7431035
Link To Document :
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