DocumentCode :
3759845
Title :
Design and TCAD simulations of planar active-edge pixel sensors for future XFEL applications
Author :
Gian-Franco Dalla Betta;Giovanni Batignani;Mohamed El Amine Benkechkache;Stefano Bettarini;Giulia Casarosa;Daniele Comotti;Lorenzo Fabris;Francesco Forti;Marco Grassi;Saida Latreche-Lassoued;Luca Lodola;Piero Malcovati;Massimo Manghisoni;Roberto Mendicino
Author_Institution :
TIFPAINFN, Italy
fYear :
2014
Firstpage :
1
Lastpage :
3
Abstract :
We report on the design and TCAD simulations of planar active-edge pixel sensors within the INFN PixFEL project. These devices are intended as one of the building blocks for the assembly of a multilayer, four-side buttable tile for X-ray imaging applications in future Free Electron Laser facilities. The requirements in terms of very wide dynamic range and tolerance to extremely high ionizing radiation doses call for high operation voltages. A comprehensive TCAD simulation study is presented, aimed at the best trade-offs between the minimization of the edge region size and the sensor breakdown voltage.
Keywords :
"Substrates","Photonics","Ionizing radiation sensors","Image edge detection","Detectors","Junctions"
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2014 IEEE
Type :
conf
DOI :
10.1109/NSSMIC.2014.7431078
Filename :
7431078
Link To Document :
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