DocumentCode :
3759945
Title :
Modeling of temperature and field dependent effective hole mobility at high fields in amorphous selenium
Author :
Nour Hijazi;M. Z. Kabir
Author_Institution :
Electrical and Computer Engineering Department, Concordia University, 1455 Blvd. de Maisonneuve West, Montreal, QC, H3G 1M8, Canada
fYear :
2014
Firstpage :
1
Lastpage :
3
Abstract :
An analytical model is presented to show the mechanisms of the electric field and temperature dependent effective drift mobility of holes in amorphous selenium (a-Se) considering the density of states distribution, thermally activated tunneling for the field enhancement release rate, and carrier heating. In addition, the model for the field-dependent microscopic mobility considering carrier heating is also proposed. The results of this model are fitted with the published experimental results on effective mobility with wide variations of applied electric fields and temperatures. The analyses of these fittings revealed that the microscopic mobility in a-Se decreases whereas the effective drift mobility increases with increasing the field and temperature.
Keywords :
"Selenium","Electric fields","Tunneling","Temperature dependence","Temperature sensors","X-ray imaging","Impact ionization"
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2014 IEEE
Type :
conf
DOI :
10.1109/NSSMIC.2014.7431180
Filename :
7431180
Link To Document :
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