Title :
DFT guidance through RTL test justification and propagation analysis
Author :
Y. Makris;A. Orailoglu
Author_Institution :
Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
Abstract :
We introduce a formal mechanism for capturing test justification and propagation related behavior of blocks. Based on the identified test translation behavior, an RTL testability analysis methodology for hierarchical designs is derived. An algorithm for pinpointing the local-to-global test translation controllability and observability bottlenecks is presented. The analysis results are validated through an ATPG-based experimental flow and the applicability of the scheme for addressing test challenges in large designs by guiding DFT decisions is discussed.
Keywords :
"Circuit testing","Logic testing","Design for testability","Computer science","Reliability engineering","System testing","Design methodology","Controllability","Observability","Silicon"
Conference_Titel :
Test Conference, 1998. Proceedings., International
Print_ISBN :
0-7803-5093-6
DOI :
10.1109/TEST.1998.743211