DocumentCode :
3760071
Title :
DFT guidance through RTL test justification and propagation analysis
Author :
Y. Makris;A. Orailoglu
Author_Institution :
Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
fYear :
1998
Firstpage :
668
Lastpage :
677
Abstract :
We introduce a formal mechanism for capturing test justification and propagation related behavior of blocks. Based on the identified test translation behavior, an RTL testability analysis methodology for hierarchical designs is derived. An algorithm for pinpointing the local-to-global test translation controllability and observability bottlenecks is presented. The analysis results are validated through an ATPG-based experimental flow and the applicability of the scheme for addressing test challenges in large designs by guiding DFT decisions is discussed.
Keywords :
"Circuit testing","Logic testing","Design for testability","Computer science","Reliability engineering","System testing","Design methodology","Controllability","Observability","Silicon"
Publisher :
ieee
Conference_Titel :
Test Conference, 1998. Proceedings., International
ISSN :
1089-3539
Print_ISBN :
0-7803-5093-6
Type :
conf
DOI :
10.1109/TEST.1998.743211
Filename :
743211
Link To Document :
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