DocumentCode :
3760275
Title :
Research and application of network load stress test for smart substation
Author :
Ming Cai;Qi Xiao;Yuyun Chen;Wenxing Cheng;Xiaobing Zhou;Zhihua Wang
Author_Institution :
State Grid Jiangxi Electric Power Company, Maintenance Branch, Nanchang, Jiangxi, China
fYear :
2015
Firstpage :
1125
Lastpage :
1130
Abstract :
Load stress test of secondary equipment network is important for the large-scale construction of smart substations. In this article, several secondary equipment network schemes and their influence on relays related IEDs are discussed, and then stress test objects, principles for smart substation are proposed. Based on embedded CPU and large-scale FPGA, load stress testing device for secondary equipment network in smart substation is implemented with characteristic of supplying multi-type stress data stream along with IEDs´ necessary working stream, and field test practice is introduced in the end.
Keywords :
"Stress","Substations","Power industry","Relays","Field programmable gate arrays","Hardware","Software design"
Publisher :
ieee
Conference_Titel :
Electric Utility Deregulation and Restructuring and Power Technologies (DRPT), 2015 5th International Conference on
Type :
conf
DOI :
10.1109/DRPT.2015.7432401
Filename :
7432401
Link To Document :
بازگشت