DocumentCode
3762345
Title
Foreword
Author
Jason Ryan
Author_Institution
NIST, Maryland, United States
fYear
2015
Abstract
It is my pleasure to present the final report of the 2015 IEEE International Integrated Reliability Workshop (IIRW). This report summarizes everything we accomplished this year; everyone involved should be proud of its contents.
Publisher
ieee
Conference_Titel
Integrated Reliability Workshop (IIRW), 2015 IEEE International
Print_ISBN
978-1-4673-7395-1
Electronic_ISBN
2374-8036
Type
conf
DOI
10.1109/IIRW.2015.7437011
Filename
7437011
Link To Document