• DocumentCode
    3762345
  • Title

    Foreword

  • Author

    Jason Ryan

  • Author_Institution
    NIST, Maryland, United States
  • fYear
    2015
  • Abstract
    It is my pleasure to present the final report of the 2015 IEEE International Integrated Reliability Workshop (IIRW). This report summarizes everything we accomplished this year; everyone involved should be proud of its contents.
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop (IIRW), 2015 IEEE International
  • Print_ISBN
    978-1-4673-7395-1
  • Electronic_ISBN
    2374-8036
  • Type

    conf

  • DOI
    10.1109/IIRW.2015.7437011
  • Filename
    7437011