• DocumentCode
    3762350
  • Title

    Defect limited reliability and transport in carbon nanotube and graphene devices

  • Author

    David Estrada

  • Author_Institution
    Integrated NanoMaterials Laboratory, Dept. of Materials Science and Engineering, Boise State University, 1910 University Dr., ID 83725, United States
  • fYear
    2015
  • Firstpage
    2
  • Lastpage
    2
  • Abstract
    A recent report by the U.S. Energy Information Agency indicates that global energy consumption has increased by approximately 40% over the past 15 years, due in large part to advances in information technology and increased energy demand in residential and commercial buildings. Tackling such a looming challenges is going to require innovation and scientific discovery. Nanotechnology will be an important aspect of this process. In particular, carbon nanomaterials (e.g. 1-dimensional carbon nanotubes and 2-dimensional graphene) show great potential for the development of energy efficient nanoelectronics and thermal management materials. This is attributed to their inherent low-dimensions, high carrier mobility, and large thermal conductivity. The ability to tune these intrinsic properties by introducing defects or engineering external influences creates interesting fundamental challenges and new opportunities. In this talk I will discuss the role of such defects on reliability, power dissipation, and thermal transport in carbon nanotube and graphene based devices and films.
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop (IIRW), 2015 IEEE International
  • Print_ISBN
    978-1-4673-7395-1
  • Electronic_ISBN
    2374-8036
  • Type

    conf

  • DOI
    10.1109/IIRW.2015.7437055
  • Filename
    7437055