DocumentCode :
3762373
Title :
Study of the impact of dielectric aging on coplanar waveguide performance
Author :
Anh Phuong Nguyen;Ulrike L?ders;Frederic Voiron
Author_Institution :
IPDIA, R&D, 2 Rue de la Girafe, 14000 Caen, France
fYear :
2015
Firstpage :
103
Lastpage :
106
Abstract :
In this paper, we study the impact of electrical and thermal stress on line loss and characteristic impedance of a CoPlanar Waveguides (CPWs). The de-rating of the line propagation constants and impedance characteristic are analyzed and discussed with respect to the stress level applied to the dielectric. The physical mechanisms leading to dielectric properties variation is explained.
Keywords :
"Stress","Coplanar waveguides","Dielectrics","Silicon","Impedance","Substrates","Temperature measurement"
Publisher :
ieee
Conference_Titel :
Integrated Reliability Workshop (IIRW), 2015 IEEE International
Print_ISBN :
978-1-4673-7395-1
Electronic_ISBN :
2374-8036
Type :
conf
DOI :
10.1109/IIRW.2015.7437078
Filename :
7437078
Link To Document :
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