مرکز منطقه ای اطلاع رساني علوم و فناوري - Discussion group summaries [multiple presentation summaries]

DocumentCode :

3762393

Title :

Discussion group summaries [multiple presentation summaries]

fYear :

2015

Firstpage :

162

Lastpage :

174

Keywords :

"Reliability","Logic gates","Tutorials","Heating","Hot carriers","Degradation","Resilience"

Publisher :

ieee

Conference_Titel :

Integrated Reliability Workshop (IIRW), 2015 IEEE International

Print_ISBN :

978-1-4673-7395-1

Electronic_ISBN :

2374-8036

Type :

conf

DOI :

10.1109/IIRW.2015.7437098

Filename :

7437098

Link To Document :