DocumentCode :
3762841
Title :
Accelerated lifetime tests and failure analysis of an electro-thermally actuated MEMS valve
Author :
H. Skima;K. Medjaher;C. Varnier;N. Zerhouni;E. Dedu;J. Bourgeois
Author_Institution :
University of Franche-Comt? (UFC), FEMTO-ST Institute, UMR CNRS 6174 - UFC / ENSMM, 15B av. des Montboucons, Besan?on, France
fYear :
2015
Firstpage :
75
Lastpage :
78
Abstract :
This paper presents accelerated lifetime tests for an electro-thermally actuated MEMS valve in order to identify and analyze its failures. To perform the different tests, two experimental setup are specially designed. Tests consist in cycling several MEMS valves by changing at each test the operating condition: with unfiltered air, without air and with filtered air. Results show that different failure mechanisms can be detected depending on the operating conditions of the MEMS valve.
Keywords :
"Reliability","Valves","Micromechanical devices","Fluids","Biomedical imaging","Pins","Lifetime estimation"
Publisher :
ieee
Conference_Titel :
Microelectronics (ICM), 2015 27th International Conference on
Electronic_ISBN :
2159-1679
Type :
conf
DOI :
10.1109/ICM.2015.7437991
Filename :
7437991
Link To Document :
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