DocumentCode
3762875
Title
A SWOT analysis of TSV: Strengths, weaknesses, opportunities, and threats
Author
Khaled Salah
Author_Institution
Mentor Graphics, Cairo, Egypt
fYear
2015
Firstpage
214
Lastpage
217
Abstract
SWOT analysis is one of the most powerful analysis techniques. It is useful in exploring possibilities for new efforts or solutions to problems and making decisions about the best path. In this paper, SWOT analysis for TSV assessment is presented. The aim of this work is to analyze TSV-Based 3D integration from various perspectives and to determine its strengths, weaknesses, opportunities and threats.
Keywords
"Three-dimensional displays","Integrated circuit interconnections","Through-silicon vias","Design automation","Couplings","Integrated circuit modeling"
Publisher
ieee
Conference_Titel
Microelectronics (ICM), 2015 27th International Conference on
Electronic_ISBN
2159-1679
Type
conf
DOI
10.1109/ICM.2015.7438026
Filename
7438026
Link To Document