DocumentCode
3763133
Title
A method to measure displacement of microscale structures with high resolution and large stroke for cellular characterization
Author
Hirotaka Sugiura;Shinya Sakuma;Makoto Kaneko;Fumihito Arai
Author_Institution
Dept. of Micro-Nano Systems Engineering, Nagoya University, Furo-cho, Chilisa-ku, 464-8603, JAPAN
fYear
2015
Firstpage
1
Lastpage
2
Abstract
We propose a method to measure displacement of microscale structures with high sensing resolution and large stroke on focal plane of microscopy. Using this method, measurable displacement become approximately 10 times larger than that of the conventional method, and the resolution is kept as small as tens nm order.
Keywords
"Image resolution","Sensors","Gray-scale"
Publisher
ieee
Conference_Titel
Micro-NanoMechatronics and Human Science (MHS), 2015 International Symposium on
Type
conf
DOI
10.1109/MHS.2015.7438287
Filename
7438287
Link To Document