• DocumentCode
    3763778
  • Title

    XOR gates for low-energy and near-Vth operation

  • Author

    Azam Beg;Ajmal Beg;Amr Elchouemi

  • Author_Institution
    United Arab Emirates University, Al Ain, UAE
  • fYear
    2015
  • Firstpage
    49
  • Lastpage
    52
  • Abstract
    XOR gates are essential components of many logic circuits. With the aim of reducing energy dissipation, this paper proposes the use of genetic-algorithm-based optimization for XOR gates operating in the near-threshold region. We applied the proposed technique on four different types of XOR gates built using 22 nm devices. The resultant energy savings for the optimized gates ranged from 28% to 48% when compared with the traditionally-sized gates. The areas of the energy-optimized gates are also appreciably less than their conventional counterparts. The presented technique can be readily used for optimizing the gates for power, performance, noise-margin, etc.
  • Keywords
    "Logic gates","Delays","Transistors","Optimization","Current measurement","Reliability","CMOS integrated circuits"
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits, and Systems (ICECS), 2015 IEEE International Conference on
  • Type

    conf

  • DOI
    10.1109/ICECS.2015.7440246
  • Filename
    7440246