DocumentCode :
3763778
Title :
XOR gates for low-energy and near-Vth operation
Author :
Azam Beg;Ajmal Beg;Amr Elchouemi
Author_Institution :
United Arab Emirates University, Al Ain, UAE
fYear :
2015
Firstpage :
49
Lastpage :
52
Abstract :
XOR gates are essential components of many logic circuits. With the aim of reducing energy dissipation, this paper proposes the use of genetic-algorithm-based optimization for XOR gates operating in the near-threshold region. We applied the proposed technique on four different types of XOR gates built using 22 nm devices. The resultant energy savings for the optimized gates ranged from 28% to 48% when compared with the traditionally-sized gates. The areas of the energy-optimized gates are also appreciably less than their conventional counterparts. The presented technique can be readily used for optimizing the gates for power, performance, noise-margin, etc.
Keywords :
"Logic gates","Delays","Transistors","Optimization","Current measurement","Reliability","CMOS integrated circuits"
Publisher :
ieee
Conference_Titel :
Electronics, Circuits, and Systems (ICECS), 2015 IEEE International Conference on
Type :
conf
DOI :
10.1109/ICECS.2015.7440246
Filename :
7440246
Link To Document :
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