Title :
Bit-error-rate analysis and mixed signal triple modular redundancy methods for data converters
Author :
Jason Muhlestein;Hariprasath Venkatram;Jon Guerber;Allen Waters;Un-Ku Moon
Author_Institution :
School of Electrical Engineering and Computer Science, Oregon State University, Corvallis OR, 97330
Abstract :
This paper analyzes the effect of bit error rate on ADC performance and presents triple modular redundancy method for data converters. A comparison among different analog to digital converters (including successive approximation register, algorithmic/cyclic, and pipeline ADC architectures) are discussed. It is shown that a multi-path architecture provides the ability to measure and correct bit errors, squaring the bit error performance without additional analog area or power. We provide a comparative study of bit error rate among the different architectures and an error power calculation method that may be applied to further variations on these architectures, without time-consuming transient simulations.
Keywords :
"Pipelines","Bit error rate","Redundancy","Error probability","Signal to noise ratio","Computer architecture","Analog-digital conversion"
Conference_Titel :
Electronics, Circuits, and Systems (ICECS), 2015 IEEE International Conference on
DOI :
10.1109/ICECS.2015.7440338