Title :
Analysis of waveguide architectures of high-power diode lasers by near-field scanning optical microscopy
Author :
Lienau, C. ; Guenther, T. ; Malyarchuk, V. ; Tomm, J.W.
Author_Institution :
Max-Born-Inst. fur Nichtlineare Optik und Kurzzeitspektroskopie, Berlin, Germany
Abstract :
A study of laser diodes with different waveguide architectures by means of near-field scanning optical microscopy (NSOM) is presented. Mode profiles of waveguides are directly imaged and a novel contrast mechanism of NSOM is demonstrated.
Keywords :
OBIC; laser modes; near-field scanning optical microscopy; photoconductivity; quantum well lasers; waveguide lasers; active quantum-wells; contrast mechanism; defect concentration; direct imaging; emission-mode NSOM; high-power diode lasers; large optical cavity diode lasers; mode profiles; near-field OBIC; near-field scanning optical microscopy; phase information; phase shift; resonant excitation; surface excitation; waveguide architectures; Diode lasers; Fiber lasers; Laser excitation; Light sources; Optical beams; Optical coupling; Optical microscopy; Optical waveguides; Stimulated emission; Waveguide lasers;
Conference_Titel :
Lasers and Electro-Optics, 2001. CLEO/Pacific Rim 2001. The 4th Pacific Rim Conference on
Conference_Location :
Chiba, Japan
Print_ISBN :
0-7803-6738-3
DOI :
10.1109/CLEOPR.2001.970596
