• DocumentCode
    376420
  • Title

    A novel protection equipment of test transformer

  • Author

    Jian, Wang ; Wei, Li ; Zhiyuan, Cai ; Shaohua, Ma ; Yishan, Gong ; Chuan, Lu

  • Author_Institution
    Sch. of Electr. Eng., Shenyang Univ. of Technol., China
  • Volume
    1
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    227
  • Abstract
    EPEROV test transformer overvoltage protection equipment has been designed by the authors. This kind of protection equipment has proved to be one of the best candidates for the protection of test transformers. Compared with conventional methods, EPEROV is a newly developed technical measure of protecting test transformers. It consists of a pair of SCRs (silicon-controlled rectifiers) connected in negative parallel on the primary of the test transformer, C1 and C2 (voltage divider capacitors), a voltage comparator, logic output time circuit, input stage, amplifier stage and wide broad pulse row. The basic principle of EPEROV is that when a flashover occurs on the secondary of a test transformer, the pair of SCRs connected in negative parallel will short circuit the primary of the test transformer instantly, so as to cost the energy of the secondary. Therefore, the overvoltage will be inhibited effectively. At the time of the writing of this paper, EPEROV has completed two years of successful and reliable operation
  • Keywords
    AC-DC power convertors; comparators (circuits); flashover; overvoltage protection; power transformer protection; rectifying circuits; transformer windings; EPEROV test transformer overvoltage protection equipment; flashover; primary windings; secondary windings; short circuit; silicon-controlled rectifier; voltage divider capacitor; Capacitors; Circuit testing; Logic circuits; Logic testing; Protection; Pulse amplifiers; Pulse circuits; Pulse transformers; Rectifiers; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Machines and Systems, 2001. ICEMS 2001. Proceedings of the Fifth International Conference on
  • Conference_Location
    Shenyang
  • Print_ISBN
    7-5062-5115-9
  • Type

    conf

  • DOI
    10.1109/ICEMS.2001.970652
  • Filename
    970652