DocumentCode :
3764217
Title :
Stepped-Line Text Layout with Phrased Segmentation for Readability Improvement of Japanese Electronic Text
Author :
Jumpei Kobayashi;Takashi Sekiguchi;Eiji Shinbori;Toshio Kawashima
Author_Institution :
Dai Nippon Printing Co., Ltd., Tokyo, Japan
fYear :
2015
Firstpage :
553
Lastpage :
558
Abstract :
We propose a new electronic text format with a stepped-line layout to optimize viewing position and to improve the efficiency of reading Japanese text. Generally, the reader´s eyes try to fixate on every phrase while reading Japanese text. To date, no method has been proposed to optimize the fixation position while reading. In case of spaced text such as English, the space characters provide the boundary information for eye movement, however, in case of Japanese text, reading speed decreases by inserting spaces between phrases. With the new stepped-line text format proposed in this report, a text line is segmented and stepped down between phrases, moreover, line breaks are present between phrases. To evaluate the effect of the stepped-line layout on the reading efficiency, we measured reading speeds and eye movements for both the new layout and a conventional straight-line layout. The reading speed for the new stepped-line layout is approximately 13% faster compared to the straight-line layout, whereas the number of fixations in the stepped-line layout is approximately 11% less than that in the straight-line layout. This is primarily achieved by a reduction in the number of regressions and an increase in the forward saccade length. Moreover, 91% of participants did not experience illegibility or incongruousness with the stepped-line layout reading, suggesting that the stepped-line layout is a new technique for improving the efficiency of eye movements while reading without any increase in cognitive load.
Keywords :
"Layout","Feeds","Atmospheric measurements","Particle measurements","Standards","Benchmark testing","Tablet computers"
Publisher :
ieee
Conference_Titel :
Multimedia (ISM), 2015 IEEE International Symposium on
Type :
conf
DOI :
10.1109/ISM.2015.87
Filename :
7442395
Link To Document :
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