DocumentCode
376600
Title
Analysis of radiation force for a spherical particle near a substrate illuminated by a tightly focused laser beam
Author
Inami, W. ; Kawata, Y.
Author_Institution
Dept. of Mech. Eng., Shizuoka Univ., Hamamatsu, Japan
Volume
2
fYear
2001
fDate
15-19 July 2001
Abstract
We analyzed the radiation force of a spherical particle near a substrate, When a particle near a substrate is illuminated with laser light, the radiation force was determined by the multiscattering between the particle and the substrate. We developed an analysis method including the multiscattering. The comparison of radiation force with and without the substrate is presented.
Keywords
laser cooling; light scattering; radiation pressure; Mie scattering extended; electric field distributions; electromagnetic field distributions; laser-trapping; multiscattering; plane-wave decompositions; radiation force; spherical particle near substrate; tightly focused laser beam illuminated; trapped position shifts; Dielectric substrates; Electromagnetic fields; Electromagnetic radiation; Electromagnetic scattering; Force measurement; Laser beams; Lenses; Light scattering; Particle beams; Refractive index;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2001. CLEO/Pacific Rim 2001. The 4th Pacific Rim Conference on
Conference_Location
Chiba, Japan
Print_ISBN
0-7803-6738-3
Type
conf
DOI
10.1109/CLEOPR.2001.970972
Filename
970972
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