Title :
Effects of optical polarization in reflection-mode near-field optical microscopy
Author :
Sasagawa, K. ; Yoshida, H. ; Tokuda, T. ; Ohta, J. ; Nunoshita, M.
Author_Institution :
Graduate Sch. of Mater. Sci., Nara Inst. of Sci. & Technol., Japan
Abstract :
The polarization dependence of reflection-mode SNOM observation is characterized. An Al/glass grating with a fine structure is observed by SNOM. SNOM images observed with parallel- and perpendicular-polarized light show different feature each other. The difference is also studied by means of computer simulations.
Keywords :
aluminium; diffraction gratings; light polarisation; light reflection; near-field scanning optical microscopy; Al; Al/glass grating; computer simulation; coupled-dipole approximation; optical polarization effect; parallel-polarized light; perpendicular-polarized light; reflection-mode SNOM; self-consistent fields; total scattered field; Apertures; Gratings; Light scattering; Optical feedback; Optical fiber polarization; Optical films; Optical microscopy; Optical polarization; Optical scattering; Probes;
Conference_Titel :
Lasers and Electro-Optics, 2001. CLEO/Pacific Rim 2001. The 4th Pacific Rim Conference on
Conference_Location :
Chiba, Japan
Print_ISBN :
0-7803-6738-3
DOI :
10.1109/CLEOPR.2001.970981
