DocumentCode
376609
Title
Effects of optical polarization in reflection-mode near-field optical microscopy
Author
Sasagawa, K. ; Yoshida, H. ; Tokuda, T. ; Ohta, J. ; Nunoshita, M.
Author_Institution
Graduate Sch. of Mater. Sci., Nara Inst. of Sci. & Technol., Japan
Volume
2
fYear
2001
fDate
15-19 July 2001
Abstract
The polarization dependence of reflection-mode SNOM observation is characterized. An Al/glass grating with a fine structure is observed by SNOM. SNOM images observed with parallel- and perpendicular-polarized light show different feature each other. The difference is also studied by means of computer simulations.
Keywords
aluminium; diffraction gratings; light polarisation; light reflection; near-field scanning optical microscopy; Al; Al/glass grating; computer simulation; coupled-dipole approximation; optical polarization effect; parallel-polarized light; perpendicular-polarized light; reflection-mode SNOM; self-consistent fields; total scattered field; Apertures; Gratings; Light scattering; Optical feedback; Optical fiber polarization; Optical films; Optical microscopy; Optical polarization; Optical scattering; Probes;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2001. CLEO/Pacific Rim 2001. The 4th Pacific Rim Conference on
Conference_Location
Chiba, Japan
Print_ISBN
0-7803-6738-3
Type
conf
DOI
10.1109/CLEOPR.2001.970981
Filename
970981
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