DocumentCode
376612
Title
FDTD analysis of the collection efficiency and the spatial resolution of near-field metal-coated double-tapered probes
Author
Saivada, K. ; Kambe, H. ; Nakamura, H. ; Saiki, T.
Author_Institution
Shinshu Univ., Nagano, Japan
Volume
2
fYear
2001
fDate
15-19 July 2001
Abstract
The metal-coated double-tapered probes are numerically calculated by the FDTD method. The metal is approximated to be perfect conductor. The collection efficiency and the spatial resolution of previous experiment are well reproduced.
Keywords
finite difference time-domain analysis; image resolution; metallic thin films; near-field scanning optical microscopy; probes; FDTD analysis; NSOM; collection efficiency; near field scanning optical microscopy; near-field metal-coated double-tapered probes; perfect conductor; spatial resolution; Analytical models; Apertures; Computational modeling; Computer simulation; Conductors; Finite difference methods; Probes; Shape measurement; Spatial resolution; Time domain analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2001. CLEO/Pacific Rim 2001. The 4th Pacific Rim Conference on
Conference_Location
Chiba, Japan
Print_ISBN
0-7803-6738-3
Type
conf
DOI
10.1109/CLEOPR.2001.970985
Filename
970985
Link To Document