Title :
FDTD analysis of the collection efficiency and the spatial resolution of near-field metal-coated double-tapered probes
Author :
Saivada, K. ; Kambe, H. ; Nakamura, H. ; Saiki, T.
Author_Institution :
Shinshu Univ., Nagano, Japan
Abstract :
The metal-coated double-tapered probes are numerically calculated by the FDTD method. The metal is approximated to be perfect conductor. The collection efficiency and the spatial resolution of previous experiment are well reproduced.
Keywords :
finite difference time-domain analysis; image resolution; metallic thin films; near-field scanning optical microscopy; probes; FDTD analysis; NSOM; collection efficiency; near field scanning optical microscopy; near-field metal-coated double-tapered probes; perfect conductor; spatial resolution; Analytical models; Apertures; Computational modeling; Computer simulation; Conductors; Finite difference methods; Probes; Shape measurement; Spatial resolution; Time domain analysis;
Conference_Titel :
Lasers and Electro-Optics, 2001. CLEO/Pacific Rim 2001. The 4th Pacific Rim Conference on
Conference_Location :
Chiba, Japan
Print_ISBN :
0-7803-6738-3
DOI :
10.1109/CLEOPR.2001.970985
