DocumentCode :
376655
Title :
First observation of optical second-order nonlinearity of poled pure TeO/sub 2/ glass film prepared by novel fabrication process
Author :
Taniguchi, T. ; Tanaka, H. ; Nishimura, K. ; Usami, M.
Author_Institution :
KDD R&D Labs. Inc., Saitama, Japan
Volume :
2
fYear :
2001
fDate :
15-19 July 2001
Abstract :
We have succeeded in observation of the optical second-order nonlinearity of a pure tellurite glass film, which was synthesized by a simple sputtering method and was electrothermally poled with a unique sample structure, for the first time.
Keywords :
dielectric polarisation; nonlinear optical susceptibility; optical films; optical glass; sputter deposition; sputtered coatings; tellurium compounds; EPMA; TeO/sub 2/; X-ray diffraction; electrothermally poled; high electric field; optical second-order nonlinearity; poled pure tellurite glass film; scanning electron microscopy; second-order susceptibility; sputtered film; synthesis technique; Anodes; Crystallization; Glass; Nonlinear optics; Optical buffering; Optical films; Sputtering; Substrates; Tellurium; X-ray scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2001. CLEO/Pacific Rim 2001. The 4th Pacific Rim Conference on
Conference_Location :
Chiba, Japan
Print_ISBN :
0-7803-6738-3
Type :
conf
DOI :
10.1109/CLEOPR.2001.971032
Filename :
971032
Link To Document :
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